DE-YMS Helps MindMotion in Yield Management of MCUs

An MCU is an integrated circuit that consists of a processor unit, memory modules, I/O interfaces, clock, and other components. It is used across a broad range of embedded systems and can be classified into 4, 8, 16, 32, and 64-bit architectures. A 32-bit MCU is mainly used in the following scenarios: smart home, IoT, VFD, security protection and monitoring systems, and fingerprint identification.

Semitronix has cooperated with MindMotion, a leading supplier of general-purpose 32-bit MCUs, in providing the later with DATAEXP series for yield management and analysis. DE-YMS helps analyze MCUs to meet the requirements of AEC-Q100.

DE-YMS empowers customers to create business reports

The engineer team of MindMotion uses DE-YMS to build a template to monitor the stability of WAT/CP/FT. The template includes yield trend charts, failed bin trend charts, parameter trend charts, and OOS summary reports of parameter Cpk. The template saves the time of data cleaning and report organization and allows users to locate anomalies by using customized rules.

Data management, analysis, and tracing of the silicon lifecycle

The engineer team of MindMotion indicated that they could utilize the data visualization and analysis module of YMS Dashboard to analyze anomalies from multiple dimensions.

For example, when a customer complaint occurs, YMS can help customers retrieve all the information about the failed samples, including lot, WAT, CP, FT, and so on. DE-YMS supports cross-site correlation analysis, correlation analysis between WAT parameters and CP/FT yield, failed bins and parameters to help find the root cause of the failure. Meanwhile, DE-YMS provides a user-friendly interface that allows users to explore data from different perspectives. Users can compare yield differences, parameter differences, bin distribution differences, and map differences across fabs, testing machines, and sites.

User feedback:

Improve overall efficiency

“The customized template allows us to focus more on data analysis, saving the time for data and report organization. The easy-to-use interface makes data exploration more convenient and meets our working habits.”    --From user feedback

Comprehensive data analysis

The sensitivity analysis of parameters allows users to view the yield loss after modifying the spec of parameters.