Semitronix DATAEXP User Forum Concludes
As semiconductor manufacturing continuously advances, the challenges posted by data intensiveness are increasing evident. Apart from technical adjustments, end-to-end data analysis across the whole industry becomes crucial for improving yield. On April 28th, Semitronix hosted the Semitronix DATAEXP User Forum in Shanghai, focusing on the difficulties of semiconductor big data analysis and sharing the new developments of the DATAEXP big data analysis platform.
During the event, Semitronix launched DATAEXP-YMS, DATAEXP-DMS, DATAEXP-General, and other products, achieving a comprehensive upgrade of the big data platform, DATAEXP.
At the press conference, the development team demonstrated the new features and application scenarios of the upgraded DATAEXP. They delivered an exciting technical presentation for the industry professionals present at the conference.
DATAEXP-General Upgrades
The upgraded DATAEXP-General has undergone a complete redesign of its UI. The software provides users with an enhanced and superior user experience, coupled with improved operational speed. Along with optimizing existing functionalities, the upgraded DATAEXP-General introduces various data visualization methods and statistical analysis modules, offering users a more powerful and flexible data analysis platform.
At the same time, DATAEXP-General made a major announcement by releasing a cloud-based version based on the B/S architecture. Building upon the client version, the cloud-based version offers additional capabilities such as centralized management of digital analysis assets, automatic generation of digital reports, and the ability to build the low-code data analysis platform YMS-Lite.
Top Recommendation: DATAEXP-YMS Lite
The DATAEXP-YMS system developed by Semitronix enables data management, analysis, and tracing throughout the whole lifecycle of chips. The system supports intelligent analysis of various types of data in IC manufacturing processes, including CP, FT, WAT, INLINE, DEFECT, packaging, and testing.
With Semitronix’s profound expertise in the semiconductor manufacturing field, the system is backed by powerful algorithms and data processing capabilities. It allows user to identify the factors that impact yield with a single click and quickly perform data cleansing, linking, and integration tasks, enabling efficient analysis of inline data. The system significantly accelerates yield enhancement and the progress of process development.
During the launch event, Semitronix also introduced the DATAEXP-YMS Lite edition, which combines software and hardware into an all-in-one solution. The product supports domestically produced ARM architecture. We provide partners with the Lite-YMS solution according to their needs. The YMS-Lite edition offers customers a one-stop deployment of software and hardware and provides a more cost-effective, easily maintainable, secure, reliable, and efficient data management and analysis solution.
Efficient Defect Management and Analysis: DATAEXP-DMS
During the event, Semitronix also showcased DATAEXP-DMS, a defect management and analysis system, for the first time. The system utilizes MPP databases and microservices technology to offer high stability, availability, and scalability at both the data and application layers.
With the powerful computing capabilities of the distributed system and a user-friendly interface, users can easily retrieve, verify, and categorize defect data. In terms of cross-module analysis, the system provides a fresh user experience, enabling fast, comprehensive, and systematic identification of defect sources and prediction of kill ratio and yield impact.
DataExp-DMS can batch complete correlation analysis between defect data and yield, enabling fast traceability analysis for low-yield problems
Based on the cutting-edge AI vision technology, Semitronix developed the Auto Defect Classification (ADC) system, which demonstrates high accuracy and rapid deployment capability in defect identification. The system has been used by multiple semiconductor foundries. The system achieves an average accuracy and recall rate of over 99.5% in defect classification, with a critical defect missing rate and false positive rate both below 0.3%. This results in a remarkable 95% reduction in manual inspection costs and over a 25-fold improvement in issue localization efficiency. Based on these advantages, the DE-DMS system of Semitronix has been successfully implemented in several large fabs in China, delivering practical benefits.
Equipment monitoring and alarming: DATAEXP-FDC
DATAEXP-FDC, newly released by Semitronix, can collect various equipment sensor data, event reports, and tester alarm data in fabs. The system features high availability, concurrency, and scalability, ensuring stable analysis and computation for real-time data flow. This all-in-one solution provides rich data collection plans and flexible data analysis and computation models. It integrates with AI to enable Feature AutoSpec changes and dynamic Spec control of Raw Trace. The system builds a professional data management platform that supports advanced chart analysis, tool matching, and auto reporting, assisting users in identifying, tracing, preventing, and predicting root causes of tester issues.
DataExp-FDC enables analysis of Alarm, Feature, and RawTrace
The four products each have their own roles and complement each other, forming a complete toolchain that covers data analysis, diagnostics, monitoring, and early warning in various stages related to yield. They correlate and analyze massive amounts of data and identify and locate yield issues. This helps users take timely measures and proactively address potential risks, accelerating yield improvement and ensuring the stability of product yield. Additionally, the DATAEXP products can work together with Semitronix’s EDA products and WAT testers, providing comprehensive and advanced yield enhancement solutions. These solutions have been widely adopted by leading IC design, manufacturing, and packaging companies globally, helping them achieve full-process data analysis and control in IC manufacturing. The solutions contribute to the overall advancement of technology and process levels in the IC industry.
