• Test Chip EDA&IP
  • SmtCell Powerful Parameterized Cell Layout Design Platform
  • TCMagic Conventional Testchip Layout Automation Design Platform
  • ATCompiler Addressable Testchip Layout Automation Design Platform
  • Addressable IP Addressable Test Chip
  • ICSpider Automated Tool to Design Product-based Testchips
  • Dense Array Ultra-high-density Testchip
  • HDYS High Density Yield Scribeline
• Data Analytics
  • DE-G General Semiconductor Data Analysis
  • DE-YMS Fab Inline and Yield Data Analysis
  • DE-DMS Defect Management Analysis System
  • INF-AI One-stop AI Solution Platform for Semiconductor Manufacture
  • INF-ADC Automatic Defect Classification System
  • INF-WPA An Intelligent and Efficient Platform for Wafer Pattern Analysis
  • DE-RF RF Data Analysis Software
  • DE-FDC Equipment Monitoring System
  • DE-SPC Statistical Process Control System
  • DE-Alarm An Intelligent Yield and Quality Anomaly Detection and Alarming System
  • DE-iCASE AI Empowered Defect Analysis/ Case Tracking System Platform
  • DE-DN A Semiconductor Defect Notice and Management System
  • SemiMind An Intelligent Expert in the Semiconductor Industry Based on Large Language Models
  • DE-FBM An intelligent failure analysis system for memory chips
  • INF-TPC A real-time tool trace anomaly detection system based on unsupervised learning
  • QuickRoot AI-Accelerated System for Root Cause Analysis (RCA)
  • AutoInk A Comprehensive Die Inking System for Automotive-Grade Chip Screening
  • SemiAgent Enterprise Digital Employee Platform
• DFM Software
  • CMPEXP Efficient CMP Modeling and Simulation Tool
  • Virtual Yield Chip Yield Modeling Tool
  • PatternScan A high-performance and visualization tool for pattern matching
  • LayoutVision A powerful platform for layout integration and analysis
  • LayoutInsight An efficient tool for analyzing the geometric characteristics of chip layouts and device types
• DFT Software
  • QuanTest Design for Testing Automation & Yield Diagnostics
  • YAD A Yield Aware Diagnosis Analysis Platform

Wafer-Level Parametric Testers
• WAT Tester
  Provides accurate and highly automated testing solutions
• WLR Tester
  Check whether the device can maintain high consistency in electrical specifications
• Process Development Tester
  Utilized in the research and development stage to improve testing efficiency and accuracy
• Semitronix WLBI Test System
  An Efficient and Stable System for Wafer Level Burn-In Test

• Yield Ramp Service
  Customized services for new process node development
• DFT Design Service
  Enhances the testability of chips by inserting test circuits into the chip design

• LayoutVision Lite
  高性能的版图查看工具